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Materials
YAG (undoped) | Sapphire | BaF2 | CaF2 | Infrasil 1) | Fused silica (UV) | N-BK7 2) | N-SF10 2) | |
---|---|---|---|---|---|---|---|---|
Wavelength range free of absorption | 400 nm - 4 μm | 400 nm - 4 μm | 400 nm - 10 μm | 130 nm - 7 μm | 300 nm - 3 μm | 190 nm - 2 μm3) | 400 nm - 1.8 μm | 400 nm - 4 μm |
Refractive index at | ||||||||
200 nm | 1.49516 | 1.55051 | ||||||
300 nm | 1.45403 | 1.48779 | ||||||
500 nm | 1.8450 | 1.775 | 1.479 | 1.43648 | 1.46233 | 1.46243 | 1.5412 | 1.7432 |
1 μm | 1.8197 | 1.756 | 1.468 | 1.42888 | 1.45042 | 1.45051 | 1.5075 | 1.7039 |
3 μm | 1.7855 | 1.71 | 1.461 | 1.41785 | 1.441941 | |||
5 μm | 1.624 | 1.451 | 1.39896 | |||||
9 μm | 1.408 | 1.32677 | ||||||
Absorbing in 3 μm region | no | no | no | no | yes | yes | yes | yes |
Absorbing in 940 nm region | For higher power applications at 940 nm we recommend the fused silica SUPRASIL 300 1) and SUPRASIL 3001 / 3002 1) | |||||||
Birefringence | no | yes | no | no 4) | no | no | no | no |
Thermal expansion coefficient [10-6 K] 5) | 7 | 5 | 19 | 18 | 0.5 | 0.5 | 7 | 8 |
Resistance against temperature gradients and thermal shock | high | high | very low | low | high | high | high | medium |
LAYERTEC standard specifications for substrates with Ø 25 mm | ||||||||
surface roughness (rms) | < 0.2 nm | < 0.3 nm | < 0.3 nm | < 0.4 nm | < 0.2 nm | < 0.2 nm | < 0.3 nm | < 0.3 nm |
Flatness (plane surface) (546 nm) | λ / 10 | λ / 2 | λ / 10 | λ / 10 | λ / 10 | λ / 10 | λ / 10 | λ / 10 |
Surface figure (curved) (546 nm) | λ / 4 reg. | λ / 2 reg. | λ / 4 reg. | λ / 10 reg. | λ / 10 reg. | λ / 10 reg. | ||
Surface quality (ISO 10110) | 5 / 1 x 0.025; L2 x 0.004 Scratch-Dig 20-3 | 5 / 1 x 0.025; L20 x 0.0025 Scratch-Dig 20-3 | 5 / 3 x 0.025; L1 x 0.0025 Scratch-Dig 20-3 | 5 / 3 x 0.063; Scratch-Dig 20-10 | 5 / 1 x 0.025; L1 x 0.004 Scratch-Dig 10-3 | 5 / 1 x 0.025; L1 x 0.004 Scratch-Dig 10-3 | 5 / 2 x 0.040; L1 x 0.001 Scratch-Dig 20-10 | 5 / 2 x 0.040; L1 x 0.001 Scratch-Dig 20-10 |
1) | Registred trademark of Heraeus Quarzglas GmbH & Co. KG |
2) | Registred trademark of SCHOTT AG |
3) | Absorption band within this wavelength range, please see transmission curve |
4) | Measurable effects only in the VUV wavelength range |
5) | The values given here are rounded, because the measurements of different authors in the literature are inconsistent. Please note that the thermal expansion coefficient of crystals depends also on the crystal orientation. |